We made good use of the industrial computed tomography ( ict ) , scanning electronic micrograph ( sem ) and imaging analysis assemble to investigate the inner and surface fine structures of the cathode in quality and quantity 3 )采用ct微焦點系統(tǒng)等檢測手段對陰極基底的內部和表面微觀結構進行了定量和定性的分析,有望成為控制陰極基底的質量重要手段。